X-Strata960 - For measurement of coating thickness and material composition.

X-Strata960

An XRF analyzer for measurement of coating thickness and material composition.

Measure the thickness and/or composition of plating, coatings, and films, containing elements from Ti through U
5 layers / 15 elements / Common elements correction
Composition analysis of up to 15 elements simultaneously
Measurement method according to ISO 3497, ASTM B568 and DIN 50987

Fast and accurate
Superior performance - highest degree of confidence in results and maximum throughput.
Distance independent mode for measurement in recesses or odd shaped samples with one calibration.
Easy operation
Automatic spectrum calibration
Small spot size
Largest measurabale sample area
Distance independent measurement (option)
Auto range finder laser focus (option)
Advanced data export (option)
Integrated PC and monitor
Add unlimited number of applications in the future at no additional cost