X-MET3000TXS+ for measuring heavy metals in soils

Lightweight, easy-to-use handheld XRF analyser for fast and reliable analysis of heavy metals in soil on polluted lands - and for analysis of ores at mining sites.

Oxford Instruments has incorporated its patented PentaFET® technology
into the X-MET3000TXS+.
X-MET3000TXS+'s new PentaPIN™ detector guarantees faster analysis and lower detection limits for all elements.

• Immediate, accurate and reliable identification of polluting elements and fast definition of the limits of "hotspots"
• Quick and reliable Go/No Go decisions with the aid of fully configurable PASS/FAIL alarm
• Fast single-shot analysis of all important heavy elements in soil: Pb, As, Cr, Cu, Zn, Ni, Cd, Co, Se, Mo, Hg, Sb, Ag, Ba  
• Low detection limits for all critical elements, typically 5 - 30 ppm
• Results stored on memory card - can be transferred to a PC for inclusion in easily formatted reports
• Full compliance with US EPA Method 6200 in soil screening
• In the field, direct surface measurement for quick pre-screniong without any sample preparation
• Typically, one measurement takes 10-120 seconds, depending on the elements of interest and required accuracy
• Requires minimal training
• 5 year X-ray tube warranty, proof of its rugged and durable design
• Ideal for working in the field, off-site, or in the lab

Analysis of ores in mining industry

• Fundamental Parameter (FP) Calibration
• Empirical Calibrations
• Possibility for empirical site specific calibrations

Analysis of ores in mining industry

• Ore prospecting
• Geochemical exploration
• Mine mapping