Oxford Instruments specialises in the design, manufacture and support of innovative solutions, tools and systems for the emerging nanotechnology markets in areas such as XRF (X-ray Fluorescence) analysers , microanalysis systems, superconducting wires, NMR (nuclear magnetic resonance) magnets, cryogenic systems, plasma etch and deposition low temperature environments and coating thickness measurement.

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CMI900 - For measurement of coating thickness and material composition.

X-Strata960

CMI900

An XRF analyser for measurement of coating thickness and material composition.

Measure the thickness and/or composition of plating, coatings, thin films, containing elements from Ti through U.

  • 5 layers / 15 elements / Common elements correction
  • Composition analysis of up to 15 elements simultaneously
  • Measurement method according to ISO 3497, ASTM B568 and DIN 50987

Key Features

  • Fast and precise
  • Improved application capability
  • Laser Focus
  • Standard FP Sofware Package
  • Slotted Chamber - ease of sample loading

 

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