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CMI900 - For measurement of coating thickness and material composition.
An XRF analyser for measurement of coating thickness and material composition.
Measure the thickness and/or composition of plating, coatings, thin films, containing elements from Ti through U.
- 5 layers / 15 elements / Common elements correction
- Composition analysis of up to 15 elements simultaneously
- Measurement method according to ISO 3497, ASTM B568 and DIN 50987
Key Features
- Fast and precise
- Improved application capability
- Laser Focus
- Standard FP Sofware Package
- Slotted Chamber - ease of sample loading
Product finder
Sales & Service Contacts
Downloads and Links
- CMI900 Brochure
(1070Kb)
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