Oxford Instruments specialises in the design, manufacture and support of innovative solutions, tools and systems for the emerging nanotechnology markets in areas such as XRF (X-ray Fluorescence) analysers , microanalysis systems, superconducting wires, NMR (nuclear magnetic resonance) magnets, cryogenic systems, plasma etch and deposition low temperature environments and coating thickness measurement.

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NordlysF 400

NordlysF 400

NordlysF 400

Building upon technology that has kept the Nordlys II detector at the forefront of speed, sensitivity and SEM compatibility, NordlysF 400 now achieves indexed mapping speeds of at least 400Hz (points per second)!

Combining the speed of NordlysF 400 with the power and ease of new HKL Fast Acquisition multithreaded software, you can acquire and index (solve) diffraction patterns at a rate of at least 400 patterns every second (400Hz).

Speed does not mean compromising data quality. On suitable samples, speeds of 400Hz with hit rates of 99%. The NordlysF 400 also offers high angular accuracy and is suitable for routine PhaseID when operated at low pixel binning settings. The HKL Fast Acquisition software now makes changes to EBSP size (pixel binning) quick and easy, so that you have total control over your data acquisition.

Optimized Detector Design

  • Unique Rectangular Phosphor Screen
  • Tapered Nose

Benefits

  • Improved Spatial Resolution
  • Improved Angular Resolution
  • Optimized Combined EBSD & EDS Mapping
  • Motorized Insertion and Retraction
  • Unique Forescatter Detector (FSD) System

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