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EDS, WDS, EBSD Microanalysis
Oxford Instruments’ INCA system is the world’s leading platform for X-ray microanalysis on the Scanning Electron Microscope (SEM) and Transmission Electron Microscope (TEM). Software and detector technology for Energy Dispersive Microanalysis (EDS), as well as Wavelength Dispersive Microanalysis (WDS) and Electron Backscatter Diffraction (EBSD) are all seamlessly integrated into this single universal platform. INCA means power and productivity. The system has been designed and built using over 30 years of microanalysis experience together with valuable input from the people who use this equipment for real applications -our customers.
Microanalysis
Electron Backscatter Diffraction
The following solutions are available as part of the INCA platform:
INCAEnergy for EDS Microanalysis on a SEM
INCAEnergy TEM for EDS Microanalysis on a TEM
INCAFeature for automated feature analysis
INCASteel for the classification of steel inclusions
INCAGSR dedicated solution for Gun Shot residue analysis
INCAWave for WDS Microanalysis
INCAEnergy+ for combined EDS and WDS Microanalysis
INCASynergy for combined EDS and EBSD
INCACrystal for EBSD Microanalysis
HKL Channel 5 for EBSD Microanalysis
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